Performance evaluation of CLEFT GaAs/CuInSe/sub 2/ tandem cell circuits through solar simulator testing and computer modeling

R. Burgess, M. Flora, M. Schneider
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引用次数: 2

Abstract

CLEFT GaAs/CuInSe/sub 2/ (CIS) tandem cell development has proceeded to circuit fabrication and testing. Solar simulator tests have been conducted to characterize tandem cell circuits under various environments and configurations. Three test panels were fabricated. each containing up to 30 tandem cell modules. These panels contained circuits with the ratio of CIS cells in series to each series GaAs cell from 2:1 to 3:1 (defined as a series ratio), and circuits with 0% to 6% Imp mismatch between two substrings in series, where each substring consisted of three CIS cells in series to three GaAs cells in parallel. One panel contained a single circuit of ten closely matched 3:1 substrings in series. The electrical performance of these circuits was measured over 18 degrees C to 55 degrees C. Electrical performance test results demonstrated that a 3:1 series ratio maximizes circuit output at 28 degrees C and that current mismatch between substring circuits must be tightly controlled to prevent reverse voltage bias operation.<>
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通过太阳模拟器测试和计算机建模评估CLEFT GaAs/CuInSe/sub - 2/串联电池电路的性能
CLEFT GaAs/CuInSe/sub 2/ (CIS)串联电池的开发已经进行了电路制造和测试。在不同的环境和结构下,进行了太阳模拟器测试来表征串联电池电路。制作了三个测试板。每个包含多达30串联电池模块。这些面板包含CIS细胞串联与每个串联GaAs细胞的比例从2:1到3:1(定义为串联比例)的电路,以及两个串联子串之间0%至6% Imp不匹配的电路,其中每个子串由三个串联的CIS细胞和三个并联的GaAs细胞组成。一个面板包含一个由十个紧密匹配的3:1子串串联而成的单个电路。这些电路的电性能在18℃至55℃的温度下进行了测量,电性能测试结果表明,3:1的串联比在28℃时使电路输出最大化,必须严格控制子串电路之间的电流不匹配,以防止反向电压偏置操作。
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