First Demonstration of Waveguide-Coupled Ge0.92Sn0.08/Ge Multiple-Quantum-Well Photodetector on the SOI Platform for 2-μm Wavelength Optoelectronic Integrated Circuit

Haibo Wang, Yue Chen, Jishen Zhang, Gong Zhang, Yi-Chiau Huang, Xiao Gong
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引用次数: 1

Abstract

We report the first demonstration of a silicon-on-insulator (SOI) waveguide-coupled Ge0.92Sn0.08/Ge multiple-quantum-well (MQW) photodiode (PD) for 2 μm wavelength using a flip-chip bonding technology. The light in the waveguide couples to the PD for detection via a grating coupler. The grating coupler and waveguide were designed and fabricated on the standard SOI wafer for 2 μm and bonded with the GeSn/Ge PDs. On the same wafer, back illuminated GeSn/Ge PDs were also integrated using the same technology for free space optical detection. Our waveguide-coupled PD exhibits responsivity of 10.3 mA/W at 2 μm wavelength and one of the lowest dark current densities of 38.4 mA/cm2 for Ge1-xSnx PDs. In addition, no degradation of the dark current was found after the bonding.
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2 μm波长光电集成电路波导耦合Ge0.92Sn0.08/Ge多量子阱光电探测器在SOI平台上的首次演示
本文首次利用倒装键合技术实现了波长为2 μm的绝缘体上硅(SOI)波导耦合Ge0.92Sn0.08/Ge多量子阱(MQW)光电二极管(PD)。波导中的光通过光栅耦合器耦合到PD进行检测。在2 μm的标准SOI晶圆上设计制作了光栅耦合器和波导,并与GeSn/Ge pd键合。在同一晶圆上,采用相同的技术集成了背照GeSn/Ge pd,用于自由空间光学检测。我们的波导耦合PD在2 μm波长处的响应率为10.3 mA/W,并且具有Ge1-xSnx PD中最低的暗电流密度38.4 mA/cm2之一。此外,未发现键合后暗电流的退化。
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