{"title":"Optimal microarchitectural design configuration selection for processor hard-error reliability","authors":"Ying Zhang, Lide Duan, Bin Li, Lu Peng","doi":"10.1109/ISQED.2012.6187479","DOIUrl":null,"url":null,"abstract":"Traditional design space exploration mainly focuses on performance and power consumption. However, as one of the first-class constraints for modern processor design, the relationship between hard-error reliability and processor configurations has not been well studied. In this paper, we investigate this relationship by exploring a large processor design space. We employ a rule search strategy, i.e. Patient Rule Induction Method, to generate a set of rules which choose optimal configurations for processor hard-error reliability and its tradeoff with performance and power consumption.","PeriodicalId":205874,"journal":{"name":"Thirteenth International Symposium on Quality Electronic Design (ISQED)","volume":"3 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-03-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Thirteenth International Symposium on Quality Electronic Design (ISQED)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISQED.2012.6187479","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
Traditional design space exploration mainly focuses on performance and power consumption. However, as one of the first-class constraints for modern processor design, the relationship between hard-error reliability and processor configurations has not been well studied. In this paper, we investigate this relationship by exploring a large processor design space. We employ a rule search strategy, i.e. Patient Rule Induction Method, to generate a set of rules which choose optimal configurations for processor hard-error reliability and its tradeoff with performance and power consumption.