{"title":"Goober and Kaboodle","authors":"Charlie Krajewski","doi":"10.1364/oft.1990.owa4","DOIUrl":null,"url":null,"abstract":"A technique is discussed that allows a surface metrology system to perform data analysis on surfaces that are scratched, pitted, or even discontiguous.","PeriodicalId":354934,"journal":{"name":"Optical Fabrication and Testing","volume":"44 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Optical Fabrication and Testing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1364/oft.1990.owa4","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
A technique is discussed that allows a surface metrology system to perform data analysis on surfaces that are scratched, pitted, or even discontiguous.
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