E. Förster, P. Glas, K. Goetz, S. Joksch, P. Nickles, M. Schnürer, I. Will
{"title":"About the Sensitivity of in Situ Diffraction Measurements with X-Radiation of a Laser-Produced Plasma","authors":"E. Förster, P. Glas, K. Goetz, S. Joksch, P. Nickles, M. Schnürer, I. Will","doi":"10.1515/9783112495223-009","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":148242,"journal":{"name":"May 16","volume":"16 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1988-12-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"May 16","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1515/9783112495223-009","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}