P. Walling, A. F. Tai, H. Hamel, R. Weekly, A. Haridass
{"title":"High bandwidth low latency chip to chip interconnects using high performance MLC glass ceramic POWER4/sup R/ MCM","authors":"P. Walling, A. F. Tai, H. Hamel, R. Weekly, A. Haridass","doi":"10.1109/EPEP.2001.967668","DOIUrl":null,"url":null,"abstract":"This paper describes a high performance multi-layer ceramic (MLC) four chip glass-ceramic multi-chip module (MCM) that achieves very high bandwidth and low latency performance by incorporating unique design approaches and features. These include leveraging an I/O ring pattern arrangement using the fine line capability of IBM's High Performance Glass Ceramic (HPGC) and the capability to use 30+ wiring layers with isolating reference planes. The attendant signal integrity is assured by providing a tailored reference structure to control impedance and cross-talk coupling while maintaining the chip C4 I/O area density without requiring thin-films or degrading the power integrity.","PeriodicalId":174339,"journal":{"name":"IEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging (Cat. No. 01TH8565)","volume":"29 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2001-10-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging (Cat. No. 01TH8565)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPEP.2001.967668","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
This paper describes a high performance multi-layer ceramic (MLC) four chip glass-ceramic multi-chip module (MCM) that achieves very high bandwidth and low latency performance by incorporating unique design approaches and features. These include leveraging an I/O ring pattern arrangement using the fine line capability of IBM's High Performance Glass Ceramic (HPGC) and the capability to use 30+ wiring layers with isolating reference planes. The attendant signal integrity is assured by providing a tailored reference structure to control impedance and cross-talk coupling while maintaining the chip C4 I/O area density without requiring thin-films or degrading the power integrity.