Pseudo-exhaustive test and segmentation: formal definitions and extended fault coverage results

Abstract

Formal definitions are presented for segments and segmentations. Under these definitions, the partitionings of a circuit are a subset of the segmentations of that circuit. The fault coverage of an exhaustive test of a segment is then examined. Multiple-output segments, which have not previously been considered in the literature, are shown to present special difficulties, resulting in the definition of a novel type of segment test set. These results are used to present a formal definition for a pseudoexhaustive test using a segmentation. This definition guarantees detection of all detectable faults within segments. Consistency with previous definitions is maintained where practical.<>