The Study of Porosity and Photoluminescence Properties of Nanoporous Silicon Layer Under Anodization Current Density Formation by Double Tank Electrochemical Etching Cell

N. Atiwongsangthong
{"title":"The Study of Porosity and Photoluminescence Properties of Nanoporous Silicon Layer Under Anodization Current Density Formation by Double Tank Electrochemical Etching Cell","authors":"N. Atiwongsangthong","doi":"10.1109/ICEAST52143.2021.9426252","DOIUrl":null,"url":null,"abstract":"This research presents the effect of the constant current density on nanoporous silicon formation by double tank electrochemical etching cell without coating aluminum on the backside of silicon wafer. In this paper, the constant current density is increased from 10 mA/cm2 to 25 mA/cm2 during the anodization process by using hydrofluoric acid and ethanol at ratio 4:1 and the etching time are 10 minute. Gravimetric and Photoluminescence measurement were performed to investigate the porosity and the uniform distribution of nanoporous silicon layer respectively. The result shows that the porosity of nanoporous silicon layer was increased when the constant current density increased. The range of the porosity 46% to 80% and it is dependent on constant current density. The photoluminescence measurement with irradiate ultraviolet light on the surface of samples it was observed that hight uniformity of photoluminescence intensity. Indicates that the nanoporous silicon surface are more uniform distribution. This research discovers that the constant current density has large effect on the porosity of nanoporous silicon layer. Results show good improvement the nanoporous silicon formation by double tank electrochemical etching cell without coating aluminum on the backside of silicon.","PeriodicalId":416531,"journal":{"name":"2021 7th International Conference on Engineering, Applied Sciences and Technology (ICEAST)","volume":"42 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 7th International Conference on Engineering, Applied Sciences and Technology (ICEAST)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICEAST52143.2021.9426252","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

This research presents the effect of the constant current density on nanoporous silicon formation by double tank electrochemical etching cell without coating aluminum on the backside of silicon wafer. In this paper, the constant current density is increased from 10 mA/cm2 to 25 mA/cm2 during the anodization process by using hydrofluoric acid and ethanol at ratio 4:1 and the etching time are 10 minute. Gravimetric and Photoluminescence measurement were performed to investigate the porosity and the uniform distribution of nanoporous silicon layer respectively. The result shows that the porosity of nanoporous silicon layer was increased when the constant current density increased. The range of the porosity 46% to 80% and it is dependent on constant current density. The photoluminescence measurement with irradiate ultraviolet light on the surface of samples it was observed that hight uniformity of photoluminescence intensity. Indicates that the nanoporous silicon surface are more uniform distribution. This research discovers that the constant current density has large effect on the porosity of nanoporous silicon layer. Results show good improvement the nanoporous silicon formation by double tank electrochemical etching cell without coating aluminum on the backside of silicon.
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双槽电化学蚀刻电池阳极氧化电流密度下纳米多孔硅层孔隙率和光致发光性能的研究
本文研究了在硅片背面不镀铝的情况下,恒流密度对双槽电化学蚀刻电池形成纳米孔硅的影响。本文采用氢氟酸与乙醇以4:1的比例将恒流密度从10 mA/cm2提高到25 mA/cm2,蚀刻时间为10分钟。用重量法和光致发光法分别考察了纳米多孔硅层的孔隙率和均匀分布。结果表明,随着恒流密度的增大,纳米多孔硅层的孔隙率增大。孔隙度范围为46% ~ 80%,取决于恒流密度。用紫外光照射样品表面进行光致发光测量,观察到光致发光强度的高度均匀性。表明纳米多孔硅表面分布较为均匀。本研究发现恒定电流密度对纳米多孔硅层的孔隙率有较大影响。结果表明,双槽电化学蚀刻电池在硅背面不镀铝的情况下,对纳米多孔硅的形成有较好的促进作用。
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