M. Khorrami, P. Dixon, Todd W. Steigerwald, Haris Chowdhry
{"title":"Employment of microwave absorbers for EMI/RFI mitigations from high speed digital buses with signal integrity considerations","authors":"M. Khorrami, P. Dixon, Todd W. Steigerwald, Haris Chowdhry","doi":"10.1109/ISEMC.2016.7571564","DOIUrl":null,"url":null,"abstract":"An analysis of electromagnetic radiation reduction achieved by placement of microwave absorbers over a serial high speed digital channel is performed. The study is performed on a second generation peripheral component interconnect express (PCIe Gen II) interface with 5.0 Gbps transfer rate. A set of full wave simulations are performed on a printed circuit board with the PCIe interface implemented in an embedded micro-strip line structure. Lossy material patches are applied onto the channel to reduce the electromagnetic radiations from differential pairs. This reduction might be required especially in compact mixed signal systems as noisy digital circuits are located close to radio-frequency receivers with stringent sensitivity limits. Using the numerical solver, it has been shown that the application of the absorber can reduce the magnitude of the received electromagnetic fields at the desired locations while unfortunately affecting the signal integrity performance of the bus. In order to reduce the unintentional discontinuity introduced along the differential pairs as applying the material on the PCB, the insertion of a dielectric spacer sheet between the absorber and the solder mask is investigated. It has been shown that the presence of a thin layer of the spacer (less than 0.2mm) can significantly decrease the introduced mismatch while still keeping the benefit of the EM reduction. Full wave simulation results are being confirmed by near field probing set-up and a PCIe compliance test board.","PeriodicalId":326016,"journal":{"name":"2016 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"108 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE International Symposium on Electromagnetic Compatibility (EMC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.2016.7571564","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
Abstract
An analysis of electromagnetic radiation reduction achieved by placement of microwave absorbers over a serial high speed digital channel is performed. The study is performed on a second generation peripheral component interconnect express (PCIe Gen II) interface with 5.0 Gbps transfer rate. A set of full wave simulations are performed on a printed circuit board with the PCIe interface implemented in an embedded micro-strip line structure. Lossy material patches are applied onto the channel to reduce the electromagnetic radiations from differential pairs. This reduction might be required especially in compact mixed signal systems as noisy digital circuits are located close to radio-frequency receivers with stringent sensitivity limits. Using the numerical solver, it has been shown that the application of the absorber can reduce the magnitude of the received electromagnetic fields at the desired locations while unfortunately affecting the signal integrity performance of the bus. In order to reduce the unintentional discontinuity introduced along the differential pairs as applying the material on the PCB, the insertion of a dielectric spacer sheet between the absorber and the solder mask is investigated. It has been shown that the presence of a thin layer of the spacer (less than 0.2mm) can significantly decrease the introduced mismatch while still keeping the benefit of the EM reduction. Full wave simulation results are being confirmed by near field probing set-up and a PCIe compliance test board.
分析了在串行高速数字信道上放置微波吸收器所实现的电磁辐射减少。本研究在传输速率为5.0 Gbps的第二代外设组件互连express (PCIe Gen II)接口上进行。在采用嵌入式微带线结构实现PCIe接口的印刷电路板上进行了一组全波仿真。在通道上应用有损材料片以减少差分对的电磁辐射。这种减小可能特别需要在紧凑的混合信号系统中,因为噪声数字电路靠近具有严格灵敏度限制的射频接收器。利用数值解算器,已经表明,吸收器的应用可以降低在期望位置接收到的电磁场的大小,但不幸的是影响了总线的信号完整性性能。为了减少在PCB上施加材料时沿差分对引入的无意不连续,研究了在吸收器和阻焊板之间插入介电间隔片的方法。研究表明,薄层间隔层(小于0.2mm)的存在可以显著减少引入的失配,同时仍然保持EM降低的好处。全波模拟结果由近场探测装置和PCIe一致性测试板确认。