{"title":"Ellipse-fitting algorithm implementation in the impedance measurement system based on DAQ card with FPGA","authors":"G. Lentka, M. Targan","doi":"10.15199/48.2016.11.31","DOIUrl":null,"url":null,"abstract":"The paper presents an implementation of the ellipse-fitting algorithm in the impedance measurement system based on DAQ card equipped with FPGA chip. The method implementation was tested by simulation means as well as experimentally in the designed and presented\nmeasurement system. Finally, the limit values of sampling parameters which assures satisfying accuracy were given.","PeriodicalId":203126,"journal":{"name":"Przegląd Elektrotechniczny","volume":"18 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-11-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Przegląd Elektrotechniczny","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.15199/48.2016.11.31","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
The paper presents an implementation of the ellipse-fitting algorithm in the impedance measurement system based on DAQ card equipped with FPGA chip. The method implementation was tested by simulation means as well as experimentally in the designed and presented
measurement system. Finally, the limit values of sampling parameters which assures satisfying accuracy were given.
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