Exploring Kriging for Fast and Accurate Design Optimization of Nanoscale Analog Circuits

Oghenekarho Okobiah, S. Mohanty, E. Kougianos
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引用次数: 7

Abstract

The increasing complexity of modern electronic devices driven by consumer demand and technological advancements presents significant challenges for designers. The reduced feature size and increased capabilities lead to more complex designs as more sub-systems are packed into a single chip. Traditional synthesis and optimization methods which involve CAD tools for accurate simulation are computationally time expensive and even become infeasible especially in designs using nanoelectronic technology due to increased design factors and the exponentially increasing design space. The current objective is to explore techniques that produce optimal designs while reducing the design effort. Metamodeling techniques have been used in this respect to reduce the cost of manual iterative circuit sizing during synthesis. Existing metamodeling techniques however are unable to capture the effects of process variation which are dominant in deep nanometer regions. This work explores Kriging techniques for fast and accurate design optimization of nanoscale analog circuits.
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探索克里格法在纳米模拟电路快速精确设计优化中的应用
在消费者需求和技术进步的推动下,现代电子设备的复杂性日益增加,这对设计师提出了重大挑战。随着更多的子系统被封装到单个芯片中,功能尺寸的减小和功能的增加导致了更复杂的设计。传统的综合和优化方法需要CAD工具进行精确的仿真,由于设计因素的增加和设计空间的指数增长,特别是在使用纳米电子技术的设计中,计算时间昂贵,甚至变得不可行。当前的目标是探索在减少设计工作量的同时产生最佳设计的技术。元建模技术已在这方面使用,以减少在合成过程中手动迭代电路尺寸的成本。然而,现有的元建模技术无法捕捉在纳米深度区域占主导地位的工艺变化的影响。本研究探索了Kriging技术用于纳米级模拟电路的快速和准确的设计优化。
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