LCD BLU Defects Detection System with Sidelight

Abstract

A Cold Cathode Fluorescent Lamp(CCFL) is used as a LCD Monitor`s backlight widely. The most common way to check CCFL`s defects is an examination with the naked eye. This naked eye examination can cause examination inconsistencies and industrial disasters. A shooting environment and detection algorithms are important for finding CCFL defects automatically. This paper presents CCFL defect detection algorithms using images captured under the shooting environment with sidelight which is one of the shooting environment we have suggested. The experimental result shows 4.65% of overdetection and 5.37% of unsuccessful defect detection of CCFL.