Magnetic properties of ferromagnetic thin films obtained by Magneto-Optic Kerr Effect measurements

L. Allocca, C. Baltador, A. Morone, C. Attanasio, C. Cirillo, U. Gambardella
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Abstract

A system based on the Magneto-Optic Kerr Effect for contactless characterization of magnetic thin films has been developed. The system is made of a 635 nm laser source, two polarizers and a photo elastic modulator. The light is reflected on a thin film of magnetic material placed in the air gap of an Helmholtz pair in the longitudinal configuration. MOKE measurements have been performed to investigate the magnetic properties of thin films of different materials, as FeNi (Permalloy) and SmCo with different thicknesses, grown by magnetron sputtering and pulsed laser deposition techniques, respectively. Key magnetic features of the films are reported, as well as preliminary Kerr parameters obtained from measurements.
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磁光克尔效应测量获得铁磁薄膜的磁性能
建立了一种基于磁光克尔效应的磁薄膜非接触表征系统。该系统由一个635 nm激光源、两个偏振器和一个光弹性调制器组成。光被反射到放置在纵向结构亥姆霍兹对气隙中的磁性材料薄膜上。利用磁控溅射和脉冲激光沉积技术分别制备了不同厚度的FeNi (Permalloy)和SmCo薄膜,并进行了MOKE测量。报告了薄膜的主要磁性特征,以及从测量中获得的初步Kerr参数。
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