P. Cheynet, R. Valazco, R. Ecoffet, S. Duzellier, J. David, J.G. Loquet
{"title":"Comparison between ground tests and flight data for two static 32 KB memories","authors":"P. Cheynet, R. Valazco, R. Ecoffet, S. Duzellier, J. David, J.G. Loquet","doi":"10.1109/RADECS.1999.858646","DOIUrl":null,"url":null,"abstract":"The microelectronics and photonics testbed (MPTB) carrying twenty-four experiments on-board a scientific satellite has been in a high radiation orbit since November 1997. This paper presents single event Upset flight results on two commercial static RAMs includes in two of the MPTB experiments.","PeriodicalId":135784,"journal":{"name":"1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-09-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RADECS.1999.858646","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 9
Abstract
The microelectronics and photonics testbed (MPTB) carrying twenty-four experiments on-board a scientific satellite has been in a high radiation orbit since November 1997. This paper presents single event Upset flight results on two commercial static RAMs includes in two of the MPTB experiments.
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