{"title":"Estimation of conductivity losses in a helix slow-wave structure using eigen-mode solutions","authors":"P. Rao, S. K. Datta","doi":"10.1109/IVELEC.2008.4556452","DOIUrl":null,"url":null,"abstract":"This paper presents a simple method of estimating the attenuation constant due to conductivity losses and surface finish in a helix slow-wave structure, using the quality factor and dispersion characteristics obtainable from the eigen-mode solutions through 3D HFSS modeling. The method has been benchmarked against two practical structures published in the literature, and effect of surface finish on the attenuation constant is demonstrated.","PeriodicalId":113971,"journal":{"name":"2008 IEEE International Vacuum Electronics Conference","volume":"236 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-04-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"15","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 IEEE International Vacuum Electronics Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IVELEC.2008.4556452","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 15
Abstract
This paper presents a simple method of estimating the attenuation constant due to conductivity losses and surface finish in a helix slow-wave structure, using the quality factor and dispersion characteristics obtainable from the eigen-mode solutions through 3D HFSS modeling. The method has been benchmarked against two practical structures published in the literature, and effect of surface finish on the attenuation constant is demonstrated.
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