Feasibility of monolithic and 3D-stacked DC-DC converters for microprocessors in 90nm technology generation

G. Schrom, P. Hazucha, J. Hahn, V. Kursun, D. Gardner, S. Narendra, T. Karnik, V. De
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引用次数: 74

Abstract

Rapidly increasing input current of microprocessors resulted in rising cost and motherboard real estate occupied by decoupling capacitors and power routing. We show by analysis that an on-die switching DC-DC converter is feasible for future microprocessor power delivery. The DC-DC converter can be fabricated in an existing CMOS process (90nm-180nm) with a back-end thin-film inductor module. We show that 85% efficiency and 10% output voltage droop can be achieved for 4:1, 3:1, and 2:1 conversion ratios, area overhead of 5% and no additional on-die decoupling capacitance. A 4:1 conversion results in 3.4/spl times/ smaller input current and 6.8/spl times/ smaller external decoupling.
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90纳米微处理器单片和3d堆叠DC-DC转换器的可行性
微处理器的输入电流迅速增加,导致成本上升,主板空间被去耦电容器和电源路由所占用。我们通过分析表明,片上开关DC-DC变换器对于未来的微处理器电源传输是可行的。该DC-DC变换器可以在现有的CMOS工艺(90nm-180nm)中制造,并带有后端薄膜电感模块。我们表明,在4:1,3:1和2:1的转换比下,可以实现85%的效率和10%的输出电压下降,面积开销为5%,并且没有额外的片上去耦电容。4:1转换导致3.4/spl倍/更小的输入电流和6.8/spl倍/更小的外部去耦。
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