Thermal management for GaN power devices mounted on PCB substrates

Shuangfeng Zhang, E. Labouré, D. Labrousse, S. Lefebvre
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引用次数: 11

Abstract

This paper investigates different thermal management solutions for GaN HEMT mounted on Printed Circuit Board (PCB) substrates. Wide bandgap (WBG) power semiconductors like GaN devices have the ability to operate at high switching-frequency (from few 100 kHz to several MHz). To take advantage of their high frequency switching capabilities, the parasitic inductances of power connections as well as the connections between the dies and the gate driver must be minimized. So the majority of GaN chips available on the market are packaged so that they can be directly attached to a PCB. The embedding technology of GaN dies in PCB substrate is attractive because it offers various interconnection possibilities. However, the low thermal conductivity of glass epoxy will result in high thermal resistance of the substrate. So it is of the first importance to seek technological means in order to improve the cooling of GaN chips soldered or embedded in such PCB structures.
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安装在PCB基板上的GaN功率器件的热管理
本文研究了安装在印刷电路板(PCB)衬底上的GaN HEMT的不同热管理解决方案。像GaN器件这样的宽带隙(WBG)功率半导体具有在高开关频率(从几100khz到几MHz)下工作的能力。为了利用它们的高频开关能力,电源连接以及晶片和栅极驱动器之间的连接的寄生电感必须最小化。因此,市场上可用的大多数GaN芯片都经过封装,可以直接连接到PCB上。GaN芯片在PCB基板上的嵌入技术因其提供了多种互连可能性而具有吸引力。但玻璃环氧树脂导热系数低,会导致基材热阻高。因此,寻求技术手段来改善焊接或嵌入在这种PCB结构中的GaN芯片的冷却是至关重要的。
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