Intrinsic microcrystalline silicon deposited by remote PECVD: a new thin-film photovoltaic material

A. Wang, G. Lucovsky
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引用次数: 19

Abstract

Remote plasma-enhanced chemical-vapor deposition (remote PECVD) was used to deposit photovoltaic (PV)-grade intrinsic and n- and p-type a-Si:H, heavily doped n- and p-type mu c-Si thin films, and a photovoltaic material, a highly photoconductive intrinsic mu c-Si material. This material is deposited by compensating the native defects in the as-deposited, undoped materials with a relatively small amount of boron. The dark conductivity of this compensated intrinsic material is reduced significantly with respect to the undoped mu c-Si, and the films display a level of photoconductivity comparable to that of PV-grade intrinsic a-Si:H. In addition, the material shows no degradation in photoconductivity after long-term exposure to intense illumination ( approximately 50 mW/cm/sup 2/ for 6 h).<>
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远距离PECVD沉积本征微晶硅:一种新型光伏薄膜材料
采用远端等离子体增强化学气相沉积(Remote PECVD)技术制备了光伏(PV)级本征、n型和p型a- si:H、重掺杂n型和p型mu - si薄膜,以及光伏材料、高光导本征mu - si材料。这种材料是通过用相对少量的硼补偿沉积时未掺杂材料中的天然缺陷而沉积的。这种补偿的本征材料的暗电导率与未掺杂的mu c-Si相比显着降低,并且薄膜显示出与pv级本征a- si:H相当的光电导率。此外,该材料在长期暴露于强光照(约50 mW/cm/sup 2/ 6小时)下后,光导率没有下降。
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