{"title":"Bounded-lifetime integrated circuits","authors":"Puneet Gupta, A. Kahng","doi":"10.1145/1391469.1391560","DOIUrl":null,"url":null,"abstract":"Integrated circuits with bounded lifetimes can have many business advantages. We give some simple examples of methods to enforce tunable expiration dates for chips using nanometer reliability mechanisms.","PeriodicalId":412696,"journal":{"name":"2008 45th ACM/IEEE Design Automation Conference","volume":"21 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-06-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 45th ACM/IEEE Design Automation Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/1391469.1391560","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
Integrated circuits with bounded lifetimes can have many business advantages. We give some simple examples of methods to enforce tunable expiration dates for chips using nanometer reliability mechanisms.
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