{"title":"Contact current distortion due to the tunnel effect","authors":"E. Takano","doi":"10.1109/HOLM.1999.795939","DOIUrl":null,"url":null,"abstract":"Harmonic analyses and measurements of the tunneling currents through a thin insulating film between two electrodes have been conducted. The equation for tunneling current derived by J.G. Simmons was analyzed by Fourier expansion, and a numerical evaluation of the third harmonic ratio was performed. The theoretical third harmonic ratio was determined to be a function of s/spl psi//sub 0//sup 1/2/ (s is film thickness, /spl psi//sub 0/ is work function) and to fall between -40 and -83 dB when s was in the range of practical importance (0.4 to 2.0 nm) and /spl psi//sub 0/ was between 1 and 4 eV. Experiments on practical contacts (95Au-5Ni) indicated an actual third harmonic ratio between -50 and -130 dB. Contact resistance was measured for copper contacts with a thin insulating film. A small temperature coefficient for resistivity proved that the tunnel effect was contributing to the measurements. It was shown that the harmonic measurement could clearly detect the film, which could further deteriorate the contact performance by corrosion.","PeriodicalId":299141,"journal":{"name":"Electrical Contacts - 1999. Proceedings of the Forty-Fifth IEEE Holm Conference on Electrical Contacts (Cat. No.99CB36343)","volume":"44 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"14","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Electrical Contacts - 1999. Proceedings of the Forty-Fifth IEEE Holm Conference on Electrical Contacts (Cat. No.99CB36343)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/HOLM.1999.795939","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 14

Abstract

Harmonic analyses and measurements of the tunneling currents through a thin insulating film between two electrodes have been conducted. The equation for tunneling current derived by J.G. Simmons was analyzed by Fourier expansion, and a numerical evaluation of the third harmonic ratio was performed. The theoretical third harmonic ratio was determined to be a function of s/spl psi//sub 0//sup 1/2/ (s is film thickness, /spl psi//sub 0/ is work function) and to fall between -40 and -83 dB when s was in the range of practical importance (0.4 to 2.0 nm) and /spl psi//sub 0/ was between 1 and 4 eV. Experiments on practical contacts (95Au-5Ni) indicated an actual third harmonic ratio between -50 and -130 dB. Contact resistance was measured for copper contacts with a thin insulating film. A small temperature coefficient for resistivity proved that the tunnel effect was contributing to the measurements. It was shown that the harmonic measurement could clearly detect the film, which could further deteriorate the contact performance by corrosion.
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由于隧道效应造成的接触电流畸变
对通过两电极间绝缘薄膜的隧道电流进行了谐波分析和测量。采用傅里叶展开法对J.G. Simmons导出的隧道电流方程进行了分析,并对三次谐波比进行了数值计算。理论三次谐波比被确定为s/spl psi//sub 0//sup 1/2/ (s为薄膜厚度,/spl psi//sub 0/为功函数)的函数,当s在实际重要范围内(0.4至2.0 nm), /spl psi//sub 0/在1至4 eV之间时,三次谐波比在-40至-83 dB之间。在实际触点(95Au-5Ni)上的实验表明,实际的三次谐波比在-50和-130 dB之间。用薄绝缘膜测量了铜触点的接触电阻。电阻率温度系数很小,证明隧道效应对测量有影响。结果表明,谐波测量可以清晰地检测到薄膜,而薄膜的腐蚀会进一步恶化接触性能。
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