{"title":"Online algorithm for early stage fault detection in IGBT switches","authors":"Jason M. Anderson, R. Cox, Paul O'Connor","doi":"10.1109/DEMPED.2013.6645689","DOIUrl":null,"url":null,"abstract":"The early detection of incipient faults is desirable in mission-critical applications such as shipboard propulsion drives. This paper presents an online condition-monitoring approach for detecting early stage faults in IGBTs. The proposed algorithm extracts important device features (i.e. on-state resistance, gate charge, etc.) and compares them to healthy values recorded over a range of operating conditions. The algorithm is based on principal-components analysis (PCA). An experimental implementation in an IGBT-based drive is described, and results recorded with two different faults over a range of operating conditions are presented. The scheme integrates well with new FPGA-based gate drives and provides a powerful alternative to rules-based fault detection.","PeriodicalId":425644,"journal":{"name":"2013 9th IEEE International Symposium on Diagnostics for Electric Machines, Power Electronics and Drives (SDEMPED)","volume":"97 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"14","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 9th IEEE International Symposium on Diagnostics for Electric Machines, Power Electronics and Drives (SDEMPED)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DEMPED.2013.6645689","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 14
Abstract
The early detection of incipient faults is desirable in mission-critical applications such as shipboard propulsion drives. This paper presents an online condition-monitoring approach for detecting early stage faults in IGBTs. The proposed algorithm extracts important device features (i.e. on-state resistance, gate charge, etc.) and compares them to healthy values recorded over a range of operating conditions. The algorithm is based on principal-components analysis (PCA). An experimental implementation in an IGBT-based drive is described, and results recorded with two different faults over a range of operating conditions are presented. The scheme integrates well with new FPGA-based gate drives and provides a powerful alternative to rules-based fault detection.