{"title":"Antenna Pattern Measurement with Compressive Phase Retrieval","authors":"M. Don, G. Arce","doi":"10.1109/RWS45077.2020.9050117","DOIUrl":null,"url":null,"abstract":"Modern wireless communications is placing ever greater demands on the system’s antenna. But high-resolution, wide-band antenna radiation pattern (APR) measurement remains a slow, expensive process that can hinder research, development, and production. Previous research has shown that ARP measurement is an ideal candidate for compressive sensing, which can significantly accelerate measurement by reducing the number samples needed for pattern recovery. This paper extends this research by using compressive phase retrieval to recover full magnitude and phase patterns from magnitude measurements alone, eliminating expensive phase measurements.","PeriodicalId":184822,"journal":{"name":"2020 IEEE Radio and Wireless Symposium (RWS)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE Radio and Wireless Symposium (RWS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RWS45077.2020.9050117","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
Abstract
Modern wireless communications is placing ever greater demands on the system’s antenna. But high-resolution, wide-band antenna radiation pattern (APR) measurement remains a slow, expensive process that can hinder research, development, and production. Previous research has shown that ARP measurement is an ideal candidate for compressive sensing, which can significantly accelerate measurement by reducing the number samples needed for pattern recovery. This paper extends this research by using compressive phase retrieval to recover full magnitude and phase patterns from magnitude measurements alone, eliminating expensive phase measurements.