Formal Verification ATPG Search Engine Emulator (Abstract Only)

G. Ford, A. Krishna, J. Abraham, D. Saab
{"title":"Formal Verification ATPG Search Engine Emulator (Abstract Only)","authors":"G. Ford, A. Krishna, J. Abraham, D. Saab","doi":"10.1145/2684746.2689105","DOIUrl":null,"url":null,"abstract":"Bounded Model Checking (BMC), as a formal method of verifying VLSI circuits, shows violation of a given circuit property by finding a counter-example to the property along bounded state paths of the circuit. In this paper, we present an emulation framework for Automatic Test Pattern Generation (ATPG)-BMC model capable of checking properties on gate-level design. In our approach, counterpart to a property is mapped into a structural monitor with one output. A target fault is then injected at the monitor output, and a modified ATPG-based state justification algorithm is used to find a test for this fault which corresponds to formally establishing the property. In this paper, emulating the process of ATPG-based BMC on reconfigurable hardware is presented. The ATPG-BMC emulator achieves a speed-up over software based methods, due to the fine-grain massive parallelism inherent to hardware. As circuit sizes approach limits of even ATPG-based method feasibility, further solutions are required. In this presentation, we propose an ATPG-based algorithm for formal verification implementation on reconfigurable hardware (FPGA). This implementation is shown to have a linear relationship between the size of the circuit being verified and FPGA resource utilization. This implies a reasonable bound on the size of the implementation, as opposed to an exponential utilization explosion as circuit size increases. This method has also been shown to be 3 orders of magnitude faster than a similar software-based approach, based on the time for solving a given ATPG problem. At the same time, though, total runtime for the FPGA emulation based implementation is significantly limited by the parts of its process still in software. Further enhancement is proposed to reduce this overhead and increase the benefit over software solvers.","PeriodicalId":388546,"journal":{"name":"Proceedings of the 2015 ACM/SIGDA International Symposium on Field-Programmable Gate Arrays","volume":"57 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-02-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 2015 ACM/SIGDA International Symposium on Field-Programmable Gate Arrays","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/2684746.2689105","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

Bounded Model Checking (BMC), as a formal method of verifying VLSI circuits, shows violation of a given circuit property by finding a counter-example to the property along bounded state paths of the circuit. In this paper, we present an emulation framework for Automatic Test Pattern Generation (ATPG)-BMC model capable of checking properties on gate-level design. In our approach, counterpart to a property is mapped into a structural monitor with one output. A target fault is then injected at the monitor output, and a modified ATPG-based state justification algorithm is used to find a test for this fault which corresponds to formally establishing the property. In this paper, emulating the process of ATPG-based BMC on reconfigurable hardware is presented. The ATPG-BMC emulator achieves a speed-up over software based methods, due to the fine-grain massive parallelism inherent to hardware. As circuit sizes approach limits of even ATPG-based method feasibility, further solutions are required. In this presentation, we propose an ATPG-based algorithm for formal verification implementation on reconfigurable hardware (FPGA). This implementation is shown to have a linear relationship between the size of the circuit being verified and FPGA resource utilization. This implies a reasonable bound on the size of the implementation, as opposed to an exponential utilization explosion as circuit size increases. This method has also been shown to be 3 orders of magnitude faster than a similar software-based approach, based on the time for solving a given ATPG problem. At the same time, though, total runtime for the FPGA emulation based implementation is significantly limited by the parts of its process still in software. Further enhancement is proposed to reduce this overhead and increase the benefit over software solvers.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
正式验证ATPG搜索引擎仿真器(仅摘要)
有界模型检验(BMC)是验证VLSI电路的一种形式化方法,它通过在电路的有界状态路径上找到一个反例来显示给定电路特性是否违反。在本文中,我们提出了一个自动测试模式生成(ATPG)-BMC模型的仿真框架,该模型能够检查门级设计的属性。在我们的方法中,将属性的对应物映射到具有一个输出的结构监视器中。然后在监视器输出中注入目标故障,并使用改进的基于atpg的状态证明算法来找到该故障的测试,该测试对应于正式建立属性。本文介绍了基于atpg的BMC在可重构硬件上的仿真过程。由于硬件固有的细粒度大规模并行性,ATPG-BMC仿真器比基于软件的方法实现了加速。由于电路尺寸接近基于atpg方法可行性的极限,需要进一步的解决方案。在本报告中,我们提出了一种基于atpg的算法,用于在可重构硬件(FPGA)上实现形式验证。该实现显示在被验证电路的大小和FPGA资源利用率之间具有线性关系。这意味着对实现的大小有一个合理的限制,而不是随着电路大小的增加而呈指数级的利用率爆炸。根据解决给定ATPG问题的时间,该方法也被证明比类似的基于软件的方法快3个数量级。与此同时,基于FPGA仿真的实现的总运行时间明显受到其仍在软件中的部分过程的限制。提出了进一步的改进,以减少这种开销,并增加比软件求解器的好处。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
REPROC: A Dynamically Reconfigurable Architecture for Symmetric Cryptography (Abstract Only) Session details: Technical Session 1: Computer-aided Design Energy-Efficient Discrete Signal Processing with Field Programmable Analog Arrays (FPAAs) Energy and Memory Efficient Mapping of Bitonic Sorting on FPGA Impact of Memory Architecture on FPGA Energy Consumption
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1