Bo Hu, M. Shihab, Y. Makris, Benjamin Carrión Schäfer, C. Sechen
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引用次数: 1
Abstract
Shrinking transistor sizes are jeopardizing the reliability of runtime reconfigurable Field Programmable Gate Arrays (FPGAs), making them increasingly sensitive to aging effects such as Negative Bias Temperature Instability (NBTI). This paper introduces a reliability-aware floorplanner which is tailored to multi-context, coarse-grained, runtime reconfigurable architectures (CGRRAs) and seeks to extend their Mean Time to Failure (MTTF) by balancing the usage of processing elements (PEs). The proposed method is based on a Mixed Integer Linear Programming (MILP) formulation, the solution to which produces appropriately-balanced mappings of workload to PEs on the reconfigurable fabric, thereby mitigating aging-induced lifetime degradation. Results demonstrate that, as compared to the default reliability-unaware floorplanning solutions, the proposed method achieves an average MTTF increase of 2.5× without introducing any performance degradation.