{"title":"WELCOMF","authors":"Arijit Nath, H. Kapoor","doi":"10.1145/3370748.3406559","DOIUrl":null,"url":null,"abstract":"Emerging Non-Volatile memories such as Phase Change Memory (PCM) and Resistive RAM are projected as potential replacements of the traditional DRAM-based main memories. However, limited write endurance and high write energy limit their chances of adoption as a mainstream main memory standard. In this paper, we propose a word-level compression scheme called COMF to reduce bitflips in PCMs by removing the most repeated words from the cache lines before writing into memory. Later, we also propose an intra-line wear leveing technique called WELCOMF that extends COMF to improve lifetime. Experimental results show that the proposed technique improves lifetime by 75% and, reduce bit flips and energy by 45% and 46% respectively over baseline.","PeriodicalId":116486,"journal":{"name":"Proceedings of the ACM/IEEE International Symposium on Low Power Electronics and Design","volume":"15 1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-08-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the ACM/IEEE International Symposium on Low Power Electronics and Design","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/3370748.3406559","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 8
Abstract
Emerging Non-Volatile memories such as Phase Change Memory (PCM) and Resistive RAM are projected as potential replacements of the traditional DRAM-based main memories. However, limited write endurance and high write energy limit their chances of adoption as a mainstream main memory standard. In this paper, we propose a word-level compression scheme called COMF to reduce bitflips in PCMs by removing the most repeated words from the cache lines before writing into memory. Later, we also propose an intra-line wear leveing technique called WELCOMF that extends COMF to improve lifetime. Experimental results show that the proposed technique improves lifetime by 75% and, reduce bit flips and energy by 45% and 46% respectively over baseline.