Y. Nyanteh, L. Graber, S. Srivastava, C. Edrington, D. Cartes, H. Rodrigo
{"title":"Determination of remaining life of rotating machines in Shipboard Power Systems by modeling of dielectric breakdown mechanisms","authors":"Y. Nyanteh, L. Graber, S. Srivastava, C. Edrington, D. Cartes, H. Rodrigo","doi":"10.1109/ESTS.2013.6523710","DOIUrl":null,"url":null,"abstract":"This paper presents a model to simulate electrical trees in dielectric materials. The model accounts for the characteristic tree patterns and the partial discharges associated with the propagation of trees. This simulation model is used as basis to develop a diagnostic tool to determine the remaining life of insulation materials by relating the fractal dimension of the tree to the supply voltage and material properties. Simulation results are presented to show the performance of the prognosis method.","PeriodicalId":119318,"journal":{"name":"2013 IEEE Electric Ship Technologies Symposium (ESTS)","volume":"26 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-04-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 IEEE Electric Ship Technologies Symposium (ESTS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ESTS.2013.6523710","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
This paper presents a model to simulate electrical trees in dielectric materials. The model accounts for the characteristic tree patterns and the partial discharges associated with the propagation of trees. This simulation model is used as basis to develop a diagnostic tool to determine the remaining life of insulation materials by relating the fractal dimension of the tree to the supply voltage and material properties. Simulation results are presented to show the performance of the prognosis method.
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