Yin-Cheng Chang, Ping-Yi Wang, S. Hsu, Mao-Hsu Yen, Yen-Tang Chang, Chiu-Kuo Chen, D. Chang
{"title":"Design of the multifunction IC-EMC test board with off-board probes for evaluating a microcontroller","authors":"Yin-Cheng Chang, Ping-Yi Wang, S. Hsu, Mao-Hsu Yen, Yen-Tang Chang, Chiu-Kuo Chen, D. Chang","doi":"10.1109/APEMC.2015.7175301","DOIUrl":null,"url":null,"abstract":"A multifunction test board is designed for a microcontroller (MCU) testing. This board can be used to verify the function of the MCU by running several basic instructions. Furthermore, six different IC-EMC measurements complied with IEC standards can be performed on the same board by careful design and the preservation of test points with certified off-board probes. The experimental results show the capability of providing the confident measurements up to 1 GHz. Meanwhile, the cost of performing a bunch of different testing methods on implementing various test boards is reduced.","PeriodicalId":325138,"journal":{"name":"2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)","volume":"19 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/APEMC.2015.7175301","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 7
Abstract
A multifunction test board is designed for a microcontroller (MCU) testing. This board can be used to verify the function of the MCU by running several basic instructions. Furthermore, six different IC-EMC measurements complied with IEC standards can be performed on the same board by careful design and the preservation of test points with certified off-board probes. The experimental results show the capability of providing the confident measurements up to 1 GHz. Meanwhile, the cost of performing a bunch of different testing methods on implementing various test boards is reduced.