Design of the multifunction IC-EMC test board with off-board probes for evaluating a microcontroller

Yin-Cheng Chang, Ping-Yi Wang, S. Hsu, Mao-Hsu Yen, Yen-Tang Chang, Chiu-Kuo Chen, D. Chang
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引用次数: 7

Abstract

A multifunction test board is designed for a microcontroller (MCU) testing. This board can be used to verify the function of the MCU by running several basic instructions. Furthermore, six different IC-EMC measurements complied with IEC standards can be performed on the same board by careful design and the preservation of test points with certified off-board probes. The experimental results show the capability of providing the confident measurements up to 1 GHz. Meanwhile, the cost of performing a bunch of different testing methods on implementing various test boards is reduced.
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带板外探头的多功能IC-EMC测试板的设计
设计了一种用于单片机测试的多功能测试板。该板可以通过运行几个基本指令来验证MCU的功能。此外,通过精心设计和使用经过认证的板外探头保存测试点,可以在同一电路板上执行符合IEC标准的六种不同的IC-EMC测量。实验结果表明,该系统能够提供高达1ghz的可靠测量。同时,在实现各种测试板上执行一堆不同测试方法的成本也降低了。
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