{"title":"Lightning Susceptibility test per Mil Std 461G CS117, Translated to Engineering terms","authors":"O. Hartal","doi":"10.1109/comcas52219.2021.9629007","DOIUrl":null,"url":null,"abstract":"The Lightning Susceptibility test CS117 has been included in version G of Mil Std 461. it is given in terms of limits and method of measurement, which have no direct meaning for the engineer designing the equipment required to meet the test. This paper provides a simple method using the Laplace transforms to translate the test method and limits and some of the I/O port parameters and cable shield data to terms of expected voltages at port terminals of the tested equipment for tests conducted on shielded and unshielded cables, with some practical engineering results, enabling design of equipment compliant with the requirements.","PeriodicalId":354885,"journal":{"name":"2021 IEEE International Conference on Microwaves, Antennas, Communications and Electronic Systems (COMCAS)","volume":"15 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE International Conference on Microwaves, Antennas, Communications and Electronic Systems (COMCAS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/comcas52219.2021.9629007","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
The Lightning Susceptibility test CS117 has been included in version G of Mil Std 461. it is given in terms of limits and method of measurement, which have no direct meaning for the engineer designing the equipment required to meet the test. This paper provides a simple method using the Laplace transforms to translate the test method and limits and some of the I/O port parameters and cable shield data to terms of expected voltages at port terminals of the tested equipment for tests conducted on shielded and unshielded cables, with some practical engineering results, enabling design of equipment compliant with the requirements.
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