PIT-HOM: an Extension of Pitest for Higher Order Mutation Analysis

Thomas Laurent, Anthony Ventresque
{"title":"PIT-HOM: an Extension of Pitest for Higher Order Mutation Analysis","authors":"Thomas Laurent, Anthony Ventresque","doi":"10.1109/ICSTW.2019.00036","DOIUrl":null,"url":null,"abstract":"Mutation testing is a well-known, effective, fault-based testing criterion. First order mutation introduces defects in the form of a single small syntactic change. While the technique has been shown to be effective, it has some limits. Higher order mutation, where the faults introduced include multiple changes, has been proposed as a way to address some of these limits. Although the technique has shown promising results, there is no practical tool available for the application and study of higher order mutation on Java programs. In this paper we present PIT-HOM, an extension of Pitest (PIT) for higher order mutation. Pitest is a practical mutation analysis tool for Java, applicable on real-world codebases. PIT-HOM combines mutants in a same class to create higher order mutants of user-defined orders, it runs the mutants and reports the results in an easy to process format. We validate PIT-HOM using two small Java programs and report its performance as well as some characteristics of the mutants it creates.","PeriodicalId":310230,"journal":{"name":"2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW)","volume":"18 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICSTW.2019.00036","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6

Abstract

Mutation testing is a well-known, effective, fault-based testing criterion. First order mutation introduces defects in the form of a single small syntactic change. While the technique has been shown to be effective, it has some limits. Higher order mutation, where the faults introduced include multiple changes, has been proposed as a way to address some of these limits. Although the technique has shown promising results, there is no practical tool available for the application and study of higher order mutation on Java programs. In this paper we present PIT-HOM, an extension of Pitest (PIT) for higher order mutation. Pitest is a practical mutation analysis tool for Java, applicable on real-world codebases. PIT-HOM combines mutants in a same class to create higher order mutants of user-defined orders, it runs the mutants and reports the results in an easy to process format. We validate PIT-HOM using two small Java programs and report its performance as well as some characteristics of the mutants it creates.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
PIT-HOM: Pitest在高阶突变分析中的推广
突变检测是一种众所周知的、有效的、基于故障的检测标准。一阶突变以单个小语法变化的形式引入缺陷。虽然这项技术已被证明是有效的,但它也有一些局限性。高阶突变,其中引入的故障包括多个变化,已被提出作为解决这些限制的一种方法。尽管该技术已经显示出了很好的结果,但目前还没有实用的工具可用于Java程序的高阶突变的应用和研究。本文提出了Pitest (PIT)在高阶突变下的推广。Pitest是一个实用的Java变异分析工具,适用于真实世界的代码库。PIT-HOM将同一类中的突变体组合在一起,以创建用户定义顺序的高阶突变体,它运行这些突变体并以易于处理的格式报告结果。我们使用两个小Java程序验证了PIT-HOM,并报告了它的性能以及它创建的突变体的一些特征。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Applying Combinatorial Testing to Large-Scale Data Processing at Adobe Crucial Tool Features for Successful Combinatorial Input Parameter Testing in an Industrial Application Practical Combinatorial Testing for XSS Detection using Locally Optimized Attack Models Learning to Restrict Test Range for Compiler Test Estimating the Number of Equivalent Mutants
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1