An FPGA-based pattern generation system for functionality test of TFT-LCD panels

Abstract

To ensure the quality monitoring of a thin film transistor (TFT) - Liquid Crystal Display (LCD) panel and detect the defective products in the whole production process, this paper presents a pattern generation system for functionality test of TFT-LCD panels, which is composed of a PC-based graphic user interface (GUI) and a test signal generator. PC is mainly used to provide the GUI, which allows users to edit timing and patterns required by multiple functionality tests. Then, the edited timing and patterns are downloaded to the test signal generator in the form of test files. After downloading the test file, the test signal generator can implement the generation of LVDS signal independently out of PC. Finally, using the LVDS interface, the test signal generator can be connected to the TFT-LCD in the production line to perform the functionality test.