Nuclear Effects on Communications Systems

Abstract

A portable EMP surge arrestor test set can assure the EMP protection level at the pin level on hardened systems. EMP protection devices are susceptible to degradation caused by lightning and man-made EMI transients. Devices such as Zeners, MOV's, Gas Tubes and Filters are benign passive devices that protect electronic systems from EMP transients at the pin level. Degradation of these devices are normally not detectable by system operation. A portable EMP test set was developed that generates a transient on a protected pin and measures degradation of EMP protection devices before catastrophic failure.