Low temperature Cu-Cu thermocompression bonding assisted by electrochemical desorption of a self-assembled monolayer

Tamal Ghosh, V. Krishna, S. Singh
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Abstract

This paper reports low temperature Cu-Cu thermocompression bonding with the help of self-assembled monolayer (SAM) desorption. SAM layer protects copper from oxidation. It should be desorbed just before bonding. The desorption was carried out using cyclic voltammetry in aqueous potassium hydroxide (KOH) solution. Contact angle measurements carried out before and after desorption indicates successful desorption of SAM. The bonding was carried out at 150 °C and has yielded in excellent bond strength of 520 N.
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自组装单层的电化学解吸辅助低温Cu-Cu热压键合
本文报道了利用自组装单层(SAM)脱附的低温Cu-Cu热压键合。SAM层保护铜不被氧化。它应该在成键之前解吸。用循环伏安法在氢氧化钾水溶液中进行解吸。在解吸前后进行的接触角测量表明SAM成功解吸。在150°C下进行结合,获得了520 N的优异结合强度。
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