A repairable and diagnosable cellular array on multiple-valued logic

[1993] Proceedings of the Twenty-Third International Symposium on Multiple-Valued Logic Pub Date : 1993-05-24 DOI:10.1109/ISMVL.1993.289575

N. Kamiura, Y. Hata, K. Yamato

引用次数: 4

Abstract

A diagnosable and repairable k-valued cellular array is proposed, assuming a single fault, i.e., either a stuck-at-0 fault or a stuck-at-(k-1) fault of switches, occurs in the array. By building in a duplicate column iteratively, a fault-tolerant array can be constructed for the stuck-at-(k-1) fault, therefore, since the stuck-at-(k-1) fault need not be diagnosed, the diagnosis is simple and easy. Furthermore, the array can be repaired easily by a systematic procedure. A comparison with other rectangular arrays shows that the present array has advantages with respect to the number of cells and steps for generating all test inputs.<>

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基于多值逻辑的可修复可诊断元胞阵列

提出了一种可诊断可修复的k值元胞阵列，假设阵列中出现单个故障，即开关卡在0故障或卡在-(k-1)故障。通过迭代构建重复列，可以对卡在(k-1)故障构建容错数组，因此，由于卡在(k-1)故障不需要诊断，因此诊断简单易行。此外，该阵列可以很容易地通过系统的程序进行修复。与其它矩形阵列的比较表明，本阵列在生成所有测试输入的单元数和步骤方面具有优势

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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[1993] Proceedings of the Twenty-Third International Symposium on Multiple-Valued Logic

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