Determination of Thickness and Composition of Multielement Coatings on Computer Disks Using Energy Dispersive X-Ray Fluorescence

Abstract

Manufacturing of multielement coated disks for the computer industry generally demands close tolerances of both the com position and the thickness of the plated or coated material on the substrate alloy. Since these types of materials are opaque to the visible spectrum, the most convenient and reliable method for these determinations fall into the non-destructive technique of x-ray fluorescence.