T. Temga, C. Guerret-Piecourt, D. Juvé, D. Tréheux, C. Jardin
{"title":"Displacement current and trapping mechanisms of electric charges in TiO/sub 2/-rutile","authors":"T. Temga, C. Guerret-Piecourt, D. Juvé, D. Tréheux, C. Jardin","doi":"10.1109/CEIDP.2003.1254833","DOIUrl":null,"url":null,"abstract":"The Scanning Electron Microscopy Mirror Effect (SEMME) and the Induced Current Measurement (ICM) have been used to characterize insulators. The application of these methods to a semiconducting material of wide band gap (TiO/sub 2/) reveals that the material presents a great leakage surface current and high anisotropy of dielectric properties. The goal of the present communication is to understand and study such a behaviour.","PeriodicalId":306575,"journal":{"name":"2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2003-10-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CEIDP.2003.1254833","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
The Scanning Electron Microscopy Mirror Effect (SEMME) and the Induced Current Measurement (ICM) have been used to characterize insulators. The application of these methods to a semiconducting material of wide band gap (TiO/sub 2/) reveals that the material presents a great leakage surface current and high anisotropy of dielectric properties. The goal of the present communication is to understand and study such a behaviour.
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