{"title":"Laser inspection of defects in HV XLPE cable insulation","authors":"Z. Hong, T. Demin, Z. Hongwei, Wang Xuan","doi":"10.1109/ISEIM.1995.496503","DOIUrl":null,"url":null,"abstract":"Using the fact that under irradiation by a laser beam, black contaminants, microvoids and translucent impurities in XLPE insulation display different characteristics of light extinction and scattering, the relationships of detected pulse polarity with kinds of defects and the pulse width and amplitude with the size of the defects are found. Therefore, the detected signal can be applied for measuring and recognizing defects with the aid of a computer. The instrument for defect detection in bulk XLPE insulation is presented in this paper. It is shown in test results that the resolution of detection is 40 /spl mu/m in HV XLPE samples with volume 33.6 cm/sup 3/ at temperature 109/spl deg/C.","PeriodicalId":130178,"journal":{"name":"Proceedings of 1995 International Symposium on Electrical Insulating Materials","volume":"104 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1995-09-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of 1995 International Symposium on Electrical Insulating Materials","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEIM.1995.496503","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
Using the fact that under irradiation by a laser beam, black contaminants, microvoids and translucent impurities in XLPE insulation display different characteristics of light extinction and scattering, the relationships of detected pulse polarity with kinds of defects and the pulse width and amplitude with the size of the defects are found. Therefore, the detected signal can be applied for measuring and recognizing defects with the aid of a computer. The instrument for defect detection in bulk XLPE insulation is presented in this paper. It is shown in test results that the resolution of detection is 40 /spl mu/m in HV XLPE samples with volume 33.6 cm/sup 3/ at temperature 109/spl deg/C.
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
