{"title":"Research on Accelerated Degradation Model of Electric Meter Measurement Performance Based on Wiener Process","authors":"Peng Xiaoxiao, Zhong Chaochun, Zheng Fang, Chen Jing, Han Yuanxun, Zhang Zhenyu, Zhou Juan, Chen Jiayan","doi":"10.1109/ICCS52645.2021.9697274","DOIUrl":null,"url":null,"abstract":"With the reliability of electricity meters increasing, common accelerated life testing is hard to infer their reliability. From the perspective of degradation data which conforms to stochastic processes, this paper infers electric meter’s probability density function of measurement performance and establishes the reliability model based on Wiener process. According to the proposed model, the time to reach reliability of 91% under normal conditions is about 26 years.","PeriodicalId":163200,"journal":{"name":"2021 IEEE 3rd International Conference on Circuits and Systems (ICCS)","volume":"168 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-10-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE 3rd International Conference on Circuits and Systems (ICCS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICCS52645.2021.9697274","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
With the reliability of electricity meters increasing, common accelerated life testing is hard to infer their reliability. From the perspective of degradation data which conforms to stochastic processes, this paper infers electric meter’s probability density function of measurement performance and establishes the reliability model based on Wiener process. According to the proposed model, the time to reach reliability of 91% under normal conditions is about 26 years.
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