H. Park, Joongu Kang, Jin-seok Kim, E. Kang, H. Park, J. Seo
{"title":"Micro CT Analysis of Microholes Drilled by Focused Electron Beam Drilling Based on Image Noise Reduction Using Masking Layers","authors":"H. Park, Joongu Kang, Jin-seok Kim, E. Kang, H. Park, J. Seo","doi":"10.7735/ksmte.2022.31.6.388","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":344634,"journal":{"name":"Journal of the Korean Society of Manufacturing Technology Engineers","volume":"66 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-12-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of the Korean Society of Manufacturing Technology Engineers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.7735/ksmte.2022.31.6.388","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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