{"title":"Moire Deflectometry Utilizing \"ZYGO\" Automatic Pattern Processor System","authors":"D. Sharma, C. Delisle","doi":"10.1364/oft.1986.tha6","DOIUrl":null,"url":null,"abstract":"Moire deflectometry1,2 provides a viable alternative to interferometry for the measurement of ray deflections from a phase object. Being an incoherent technique it is free from stability problems associated with interferometry. Among the other advantages is the simplicity of the setup and use of low quality optics.","PeriodicalId":170034,"journal":{"name":"Workshop on Optical Fabrication and Testing","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Workshop on Optical Fabrication and Testing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1364/oft.1986.tha6","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Moire deflectometry1,2 provides a viable alternative to interferometry for the measurement of ray deflections from a phase object. Being an incoherent technique it is free from stability problems associated with interferometry. Among the other advantages is the simplicity of the setup and use of low quality optics.
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