Reconfigurable Germanium Quantum-Dot Arrays for CMOS Integratable Quantum Electronic Devices

I-Hsiang Wang, T. Tsai, R. Pan, P. Hong, M. Kuo, I. Chen, T. George, H. Lin, Pei-Wen Li
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引用次数: 1

Abstract

We report the first-of-kind scalability and tunability of Ge QDs that are controllably sized, closely coupled, and self-aligned with control gates, using a combination of lithographic patterning, spacer technology, and self-assembled growth. The core experimental design is based on the thermal oxidation of poly-SiGe spacer islands designated at each included-angle location of designed Si3N4/c-Si ridge structures. Multiple Ge QDs with good size tunability of 7–20 nm were controllably achieved by adjusting the process times for deposition, etch back and thermal oxidation of poly-SiGe spacer islands. Our Ge QDs array provides a common platform for engineering diverse QD electronic devices with desired reconfigurability and optimizing their performance.
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用于CMOS可积量子电子器件的可重构锗量子点阵列
我们报告了Ge量子点的可扩展性和可调性,这些量子点可以控制尺寸,紧密耦合,并与控制门自对齐,使用光刻图案,间隔技术和自组装生长的组合。核心实验设计是基于在设计的Si3N4/c-Si脊结构的每个夹角位置指定的poly-SiGe间隔岛的热氧化。通过调整poly-SiGe间隔岛的沉积时间、蚀刻回切时间和热氧化时间,实现了7 ~ 20 nm的可调锗量子点。我们的Ge量子点阵列为设计具有所需可重构性和优化其性能的各种量子点电子器件提供了一个通用平台。
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