Unified Test Generation and Application Flow for Automotive SoCs

Abstract

This paper presents an end-to-end test solution for an automotive system on chips (SoCs). The presented multipurpose solution provides the possibility to select the appropriate test mechanisms at design stage, detect manufacturing faults during the production, check the safety mechanisms during power-up, as well as run periodic test during mission mode. A software automation tool and its application to a safety critical SoC are demonstrated to show the effectiveness and completeness of the proposed flow.