Test stand for high voltage insulator partial discharge testing with ultra short X-ray pulses

D. Tehlar, U. Riechert, G. Behrmann, Markus Schraudolph
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Abstract

Top quality high voltage pre-test of solid insulating material requires long test intervals because the initiation of partial discharge (PD) in voids not only demands a sufficiently high electric field, but also the availability of a start electron. The latter leads to a statistical distribution of the time to PD inception, such that long test intervals are required to rule out the presence of voids. This makes 100% screening economically infeasible. However, if the PD is activated using ionizing radiation, the necessary test interval can be reduced to a minimum, without risking that small voids will be missed. It has already been shown that pulsed X-rays are able to trigger PD in voids and not affect the measured PD magnitude. Based on this method, known as Pulsed X-ray Induced Partial Discharge (PXIPD), a test stand for routine testing of insulators up to 420 kV has been developed and put into commercial operation. A very low measurement noise level permits an automatic analysis of the results. Already more than 20,000 insulators for installation in GIS have been screened using this PXIPD method on an industrial scale. Investigation of insulators with natural defects demonstrates the effectiveness and reliability of this new system. In combination with the short test cycle time and the ability to unambiguously link PD to a specific insulator the system allows for a leaner GIS production.
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超短x射线脉冲高压绝缘子局部放电试验台架
高质量的固体绝缘材料高压预试验需要较长的试验间隔,因为在空隙中引起局部放电不仅需要足够高的电场,而且需要有起始电子。后者导致PD开始时间的统计分布,因此需要较长的测试间隔来排除空洞的存在。这使得100%筛查在经济上不可行。但是,如果使用电离辐射激活PD,则可以将必要的测试间隔减少到最小,而不会有错过小空隙的风险。已经证明,脉冲x射线能够在空隙中触发PD,而不影响测量的PD大小。基于脉冲x射线感应局部放电(PXIPD)方法,研制了420 kV以下绝缘子常规测试试验台,并投入商业运行。非常低的测量噪声水平允许对结果进行自动分析。已经有超过20,000个安装在GIS中的绝缘子已经在工业规模上使用这种PXIPD方法进行了筛选。对具有自然缺陷的绝缘子的研究表明了该系统的有效性和可靠性。结合较短的测试周期时间和将PD明确连接到特定绝缘子的能力,该系统允许更精简的GIS生产。
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