Robust Packaged Diode Modelling with a Table-Based Approach

Abstract

A table-based nonlinear approach was used to predict the performance of a commercially packaged Schottky diode. Excellent results have been obtained which improve those of the analytical model provided by the manufacturer. Both models were extensively validated under DC, small and large-signal one-tone and two-tone excitations. Measurements for table-based model extraction and models validation were obtained by using a multi-tone nonlinear measurement system based on a LSNA. Time domain waveforms have once more been demonstrated as a key tool to compare large-signal models.