OCV-aware top-level clock tree optimization

T. Chan, Kwangsoo Han, A. Kahng, Jae-Gon Lee, S. Nath
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引用次数: 15

Abstract

The clock trees of high-performance synchronous circuits have many clock logic cells (e.g., clock gating cells, multiplexers and dividers) in order to achieve aggressive clock gating and required performance across a wide range of operating modes and conditions. As a result, clock tree structures have become very complex and difficult to optimize with automatic clock tree synthesis (CTS) tools. In advanced process nodes, CTS becomes even more challenging due to on-chip variation (OCV) effects. In this paper, we present a new CTS methodology that optimizes clock logic cell placements and buffer insertions in the top level of a clock tree. We formulate the top-level clock tree optimization problem as a linear program that minimizes a weighted sum of timing slacks, clock uncertainty and wirelength. Experimental results in a commercial 28nm FDSOI technology show that our method can improve post-CTS worst negative slack across all modes/corners by up to 320ps compared to a leading commercial provider's CTS flow.
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ocv感知的顶级时钟树优化
高性能同步电路的时钟树具有许多时钟逻辑单元(例如,时钟门控单元,多路复用器和分频器),以便在各种工作模式和条件下实现积极的时钟门控和所需的性能。因此,时钟树结构变得非常复杂,难以用自动时钟树合成(CTS)工具进行优化。在高级工艺节点中,由于片上变化(OCV)的影响,CTS变得更具挑战性。在本文中,我们提出了一种新的CTS方法,该方法优化了时钟树顶层的时钟逻辑单元放置和缓冲区插入。我们将顶层时钟树优化问题表述为一个线性规划,以最小化时序松弛、时钟不确定性和无线长度的加权总和。在商用28nm FDSOI技术上的实验结果表明,与领先的商用供应商的CTS流相比,我们的方法可以将CTS后所有模式/弯道的最坏负余量提高320ps。
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