Half circle chrome loss by electrochemical effects

D. Caspary, S. Jähne, P. Nesládek, M. Kristlib, L. Bahrig, A. Feicke, M. Kaiser, J. Lorbeer, T. Wandel
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Abstract

For certain designs, we observe a rather peculiar defect during phase-shift mask production. At distinct positions on the mask, the chrome disappears within the second level process in almost perfect half circles. This effect can even be observed if no etching is applied at all. The root cause of this defect is electrochemical dissolving of chrome in DI water during the development rinse process, which appears at locations where the chrome is in contact to the developer rinse medium. In this publication we describe the experimental set-up to investigate the root cause mechanism and propose solutions to overcome the effect.
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电化学效应造成的半圆铬损失
对于某些设计,我们在相移掩模生产过程中观察到一个相当奇特的缺陷。在掩模上的不同位置,铬在第二级工艺中几乎以完美的半圆消失。即使没有蚀刻,也可以观察到这种效应。这种缺陷的根本原因是在显影液冲洗过程中铬在去离子水中的电化学溶解,这种溶解出现在铬与显影液冲洗介质接触的位置。在这篇文章中,我们描述了实验装置,以调查根本原因机制,并提出了克服这种影响的解决方案。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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