{"title":"Oxide charge modeling with CEA-TRAPPOX code version 4. Comparison of trapping models on desktop computer","authors":"J. Leray, P. Paillet, O. Flament, A. Torres","doi":"10.1109/RADECS.1999.858546","DOIUrl":null,"url":null,"abstract":"The charge trapped in oxides depends on a large number of parameters (spatial and energetic distributions of traps, voltage and dose-rate profiles, internal space-charge effect, etc.). We demonstrate that 1D simulations with personal computers can be effective in extracting oxide parameters from experimental data, thus enabling prediction of MOS degradation in various mission profiles.","PeriodicalId":135784,"journal":{"name":"1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471)","volume":"29 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-09-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RADECS.1999.858546","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6
Abstract
The charge trapped in oxides depends on a large number of parameters (spatial and energetic distributions of traps, voltage and dose-rate profiles, internal space-charge effect, etc.). We demonstrate that 1D simulations with personal computers can be effective in extracting oxide parameters from experimental data, thus enabling prediction of MOS degradation in various mission profiles.
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
