J. Caylor, K. Coonley, J. Stuart, S. Nangaoy, T. Colpitts, R. Venkatasubramanian
{"title":"Developing PbTe-based superlattice structures with enhanced thermoelectric performance","authors":"J. Caylor, K. Coonley, J. Stuart, S. Nangaoy, T. Colpitts, R. Venkatasubramanian","doi":"10.1109/ICT.2005.1519993","DOIUrl":null,"url":null,"abstract":"The fabrication of n-type PbTe/PbTe/sub 0.75/Se/sub 0.25/ structures using a simple evaporation technique has yielded high-quality superlattice films, a significant reduction in lattice thermal conductivity and potentially enhanced thermoelectric device performance, compared to standard PbTeSe alloys. The room temperature lattice thermal conductivity of PbTeSe alloys have been reduced by a factor of two or more using PbTe/PbTeSe superlattices in the cross-plane direction. Using this advantage, we have begun characterizing the cross-plane ZT of PbTe/PbTeSe superlattice devices, including the development of appropriate Ohmic contacts for the PbTe-material system. We will discuss various device process technologies for improved Ohmic contacts. The room-temperature measurement of cross-plane figure-of-merit in n-type PbTe/PbTe/sub 0.75/Se/sub 0.25/ device structure by the transient method will be reported. Also, these results will be combined with temperature dependent measurements of in-plane resistivity and Seebeck coefficient to yield evidence of enhanced thermoelectric performance. The results from similar p-type films, as well as preliminary data on heteroepitaxial films grown on Bi/sub 2/Te/sub 3/ will be discussed.","PeriodicalId":422400,"journal":{"name":"ICT 2005. 24th International Conference on Thermoelectrics, 2005.","volume":"34 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2005-06-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"ICT 2005. 24th International Conference on Thermoelectrics, 2005.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICT.2005.1519993","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
The fabrication of n-type PbTe/PbTe/sub 0.75/Se/sub 0.25/ structures using a simple evaporation technique has yielded high-quality superlattice films, a significant reduction in lattice thermal conductivity and potentially enhanced thermoelectric device performance, compared to standard PbTeSe alloys. The room temperature lattice thermal conductivity of PbTeSe alloys have been reduced by a factor of two or more using PbTe/PbTeSe superlattices in the cross-plane direction. Using this advantage, we have begun characterizing the cross-plane ZT of PbTe/PbTeSe superlattice devices, including the development of appropriate Ohmic contacts for the PbTe-material system. We will discuss various device process technologies for improved Ohmic contacts. The room-temperature measurement of cross-plane figure-of-merit in n-type PbTe/PbTe/sub 0.75/Se/sub 0.25/ device structure by the transient method will be reported. Also, these results will be combined with temperature dependent measurements of in-plane resistivity and Seebeck coefficient to yield evidence of enhanced thermoelectric performance. The results from similar p-type films, as well as preliminary data on heteroepitaxial films grown on Bi/sub 2/Te/sub 3/ will be discussed.