{"title":"Test board design and measurement techniques for high-frequency fully-differential CMOS OTAs","authors":"D. Hsiu-Chun Chiang, R. Schaumann, W. R. Daasch","doi":"10.1109/ASIC.1997.617030","DOIUrl":null,"url":null,"abstract":"Experimental procedures and a versatile circuit board designed for testing fully-differential CMOS OTAs are presented. The techniques can be used to measure most DC and AC parameters of an OTA. The approach used leads to guidelines for OTA design.","PeriodicalId":300310,"journal":{"name":"Proceedings. Tenth Annual IEEE International ASIC Conference and Exhibit (Cat. No.97TH8334)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-09-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings. Tenth Annual IEEE International ASIC Conference and Exhibit (Cat. No.97TH8334)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASIC.1997.617030","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
Experimental procedures and a versatile circuit board designed for testing fully-differential CMOS OTAs are presented. The techniques can be used to measure most DC and AC parameters of an OTA. The approach used leads to guidelines for OTA design.
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