Study of Light Degradation in High Power LEDs as a Function of the Feeding Waveform

M. Juárez, A. Vázquez, R. Santillan, Adolfo R. López, G. Vázquez, J. M. Sosa
{"title":"Study of Light Degradation in High Power LEDs as a Function of the Feeding Waveform","authors":"M. Juárez, A. Vázquez, R. Santillan, Adolfo R. López, G. Vázquez, J. M. Sosa","doi":"10.1109/ROPEC50909.2020.9258706","DOIUrl":null,"url":null,"abstract":"This paper presents the analysis of the lifetime of a power LED based on its power waveforms. In this work, the luminous degradation of the LED is analyzed, based on the LM-80 and TM-21 Norm, comparing it with a curve fitting of the experimental data. The device under test consists of a 1W white LED, which operates for 6500 hours at a temperature of 85° C. The compared waveforms are the direct current and a rectified half-sine wave. The continuous wave presents minimal deterioration and its useful life corresponds to more than 50,000hrs. While the LED powered with a rectified sinusoidal half-wave presents a strong deterioration reducing its useful life to less than 7000 hrs., and showing a strong deterioration in its elements (silicone mold), in addition to losing its phosphor layer and emitting bluish light. The power waveform reduces the useful life of the LED since it affects its structure and its PN junction as shown in this article.","PeriodicalId":177447,"journal":{"name":"2020 IEEE International Autumn Meeting on Power, Electronics and Computing (ROPEC)","volume":"30 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-11-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE International Autumn Meeting on Power, Electronics and Computing (ROPEC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ROPEC50909.2020.9258706","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract

This paper presents the analysis of the lifetime of a power LED based on its power waveforms. In this work, the luminous degradation of the LED is analyzed, based on the LM-80 and TM-21 Norm, comparing it with a curve fitting of the experimental data. The device under test consists of a 1W white LED, which operates for 6500 hours at a temperature of 85° C. The compared waveforms are the direct current and a rectified half-sine wave. The continuous wave presents minimal deterioration and its useful life corresponds to more than 50,000hrs. While the LED powered with a rectified sinusoidal half-wave presents a strong deterioration reducing its useful life to less than 7000 hrs., and showing a strong deterioration in its elements (silicone mold), in addition to losing its phosphor layer and emitting bluish light. The power waveform reduces the useful life of the LED since it affects its structure and its PN junction as shown in this article.
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大功率led的光衰减随馈电波形的变化规律研究
本文基于功率波形分析了大功率LED的寿命。本文在LM-80和TM-21标准的基础上,对LED的光衰进行了分析,并与实验数据进行了曲线拟合。被测器件由一个1W的白光LED组成,在85℃的温度下工作6500小时,比较的波形为直流电和整流半正弦波。连续波表现出最小的劣化,其使用寿命相当于5万小时以上。而整流正弦半波供电的LED呈现出强烈的劣化,其使用寿命减少到不到7000小时。,除了失去其荧光粉层并发出蓝光外,其元素(硅胶模具)也表现出强烈的劣化。如本文所示,功率波形会影响LED的结构和PN结,从而降低LED的使用寿命。
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