{"title":"Microelectronics reliability","authors":"J.W. Meredith","doi":"10.1109/REG5.1988.15935","DOIUrl":null,"url":null,"abstract":"The author points out the importance of the involvement of the design and manufacturing team in achieving reliability of microelectronic devices. A method of verifying reliability goals through calculation of failure rates based on life test parameters is described. An example illustrating the method is shown.<<ETX>>","PeriodicalId":126733,"journal":{"name":"IEEE Region 5 Conference, 1988: 'Spanning the Peaks of Electrotechnology'","volume":"374 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"71","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Region 5 Conference, 1988: 'Spanning the Peaks of Electrotechnology'","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/REG5.1988.15935","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 71
Abstract
The author points out the importance of the involvement of the design and manufacturing team in achieving reliability of microelectronic devices. A method of verifying reliability goals through calculation of failure rates based on life test parameters is described. An example illustrating the method is shown.<>
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
